David Scott Coccarelli

Title: David Scott Coccarelli: Innovator in Coherent Scatter Imaging

Introduction

David Scott Coccarelli is a notable inventor based in Chapel Hill, NC (US). He has made significant contributions to the field of imaging technology, particularly in the area of coherent scatter imaging. His innovative approach has led to advancements that enhance the accuracy and efficiency of material identification in scanned objects.

Latest Patents

Coccarelli holds a patent for a method titled "Method for capture of small-angle scatter over wide fields of view." This patent describes a technique for estimating material coherent scatter form factors for voxels within a scan object. The method involves exposing a series of slices of the scan object to an X-ray fan beam within a coherent scatter scanner. It captures coherent scatter data at least two X-ray detector modules, which are limited to a small-angle field of view by at least one detector-side angle limiting element. This allows for the capture of small-angle scatter over a wide field of view. The aggregated collection of estimated material coherent scatter form factors is then used to estimate material types for individual model items.

Career Highlights

Throughout his career, Coccarelli has worked with reputable organizations, including Quadridox, Inc. and Duke University. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in imaging technology.

Collaborations

Coccarelli has collaborated with notable individuals in his field, including Joel Alter Greenberg and Michael E Gehm. These partnerships have fostered innovation and have been instrumental in advancing the technology related to coherent scatter imaging.

Conclusion

David Scott Coccarelli's contributions to imaging technology through his patent and collaborations highlight his role as an innovator in the field. His work continues to influence advancements in material identification and imaging techniques.