Salem, NH, United States of America

David Roy

This inventor holds 1 USPTO granted patent. Top assignee: Flir Surveillance, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Roy. Retrieved from https://idiyas.com/inventor/david-roy-6b3j4c0x

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of David Roy

Introduction

David Roy is an accomplished inventor based in Salem, NH (US). He has made significant contributions to the field of imaging technology. With a focus on innovation, he has developed a unique imaging device that showcases his expertise and creativity.

Latest Patents

David holds a patent for an imaging device, which highlights his ability to create solutions that meet modern technological needs. This patent reflects his commitment to advancing imaging technology and improving its applications in various fields.

Career Highlights

David Roy is currently employed at FLIR Surveillance, Inc., where he continues to push the boundaries of imaging technology. His work at FLIR has allowed him to collaborate with other talented professionals in the industry, further enhancing his skills and knowledge.

Collaborations

Throughout his career, David has worked alongside notable colleagues such as James Hebert and Carlos Santos. These collaborations have contributed to the development of innovative solutions and have fostered a creative environment that encourages the exchange of ideas.

Conclusion

David Roy's journey as an inventor is marked by his dedication to innovation and collaboration. His contributions to imaging technology through his patent and work at FLIR Surveillance, Inc. demonstrate his impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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