Company Filing History:
Years Active: 2009-2010
Title: The Innovations of David Reich
Introduction
David Reich is an accomplished inventor based in Carver, MN (US). He has made significant contributions to the field of substrate inspection, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of inspection systems.
Latest Patents
David's latest patents include a system for capturing, calibrating, and concatenating all-surface inspection and metrology data. This innovative approach allows for comprehensive data collection, which is crucial for improving substrate inspection processes. The applications of such data are also explored in his patents, showcasing the versatility and importance of his inventions.
Career Highlights
David Reich is currently employed at Rudolph Technologies, Inc., where he continues to develop cutting-edge technologies in the field of inspection and metrology. His expertise and innovative mindset have positioned him as a key player in his industry.
Collaborations
Throughout his career, David has collaborated with notable colleagues, including Kenneth Durden and Randall R Shay. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
David Reich's contributions to substrate inspection through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in inspection technologies, making a lasting impact on the industry.