Chagrin Falls, OH, United States of America

David R Schaller

This inventor holds 1 USPTO granted patent. Top assignee: Horizons Incorporated, a Division of Horizons Research Incorporated. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David R Schaller. Retrieved from https://idiyas.com/inventor/david-r-schaller-2wicd5gu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: David R. Schaller: Innovator in Fog Monitoring Technology

Introduction

David R. Schaller is an accomplished inventor based in Chagrin Falls, Ohio. He has made significant contributions to the field of optical development through his innovative patent. His work focuses on enhancing the quality of film development processes, particularly in controlling fog buildup.

Latest Patents

David holds a patent for a method known as the Fog Monitor. This invention involves monitoring the optical development of non-silver free radical film. The method utilizes fog buildup in a selected non-image portion of the film to control the intensity and duration of the development exposure. This ensures a desired level of contrast between image and non-image areas in the developed film. David has 1 patent to his name.

Career Highlights

David is currently employed at Horizons Incorporated, a division of Horizons Research Incorporated. His role at the company allows him to apply his expertise in film development and contribute to advancements in the industry.

Collaborations

Throughout his career, David has worked alongside notable colleagues, including Robert J. Crosby and Kenneth F. Karpinski. Their collaborative efforts have furthered the development of innovative technologies in their field.

Conclusion

David R. Schaller's contributions to fog monitoring technology exemplify his dedication to innovation in film development. His work continues to influence the industry and improve the quality of optical processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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