Albuquerque, NM, United States of America

David R Gardner

This inventor holds 1 USPTO granted patent. Top assignee: Sandia National Laboratories. Active years: 1998.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: David R Gardner: Innovator in Mechanical Systems Performance Prediction

Introduction

David R Gardner is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of mechanical systems through his innovative patent. His work focuses on enhancing the efficiency and accuracy of predicting structural performance in mechanical systems.

Latest Patents

David holds a patent for a "Process for predicting structural performance of mechanical systems." This process represents the mechanical system by a plurality of surface elements. The surface elements are grouped according to their location in the volume occupied by the mechanical system, allowing for efficient location of contacts between surface elements. This innovative approach is particularly well-suited for efficient practice on multiprocessor computers. He has 1 patent to his name.

Career Highlights

David R Gardner is associated with Sandia National Laboratories, where he applies his expertise in mechanical systems. His work at this esteemed institution has allowed him to contribute to various projects that enhance the understanding and performance of mechanical systems.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Stephen W Attaway and Steven J Plimpton. These collaborations have further enriched his work and contributed to advancements in the field.

Conclusion

David R Gardner is a distinguished inventor whose work in predicting the structural performance of mechanical systems has made a significant impact. His innovative approach and collaboration with esteemed colleagues continue to drive advancements in this important field.

Profile summary based on public USPTO records.
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