Udine, Italy

David Pilutti

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Vbc Holdings LLC. Active years: 2025.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: David Pilutti: Innovator in Image Processing Technology

Introduction

David Pilutti is a notable inventor based in Udine, Italy. He has made significant contributions to the field of image processing, particularly in methods that enhance the accuracy of confluency estimation. His innovative approach has garnered attention in both academic and industrial circles.

Latest Patents

David Pilutti holds a patent for a method titled "Segmentation-based image processing for confluency estimation." This patent describes a sophisticated technique for determining the coverage of an image using an apparatus with processing circuitry. The method involves generating a first segmentation mask by segmenting an image, applying a morphological operation to create a modified mask, and determining coverage based on the analysis of both the first and second segmentation masks. This innovative approach has the potential to improve various applications in image analysis.

Career Highlights

David is currently employed at VBC Holdings LLC, where he continues to develop and refine his expertise in image processing technologies. His work at the company reflects his commitment to advancing the field and contributing to innovative solutions.

Collaborations

David collaborates with talented individuals such as Alison Willian Gomes Dos Santos and Francesco Armani. These partnerships enhance the creative process and foster an environment of innovation.

Conclusion

David Pilutti's contributions to image processing technology exemplify the impact of innovative thinking in solving complex problems. His patent and ongoing work at VBC Holdings LLC highlight his role as a key player in the advancement of this field.

Profile summary based on public USPTO records.
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