Hudson, WI, United States of America

David Ostendorf

This inventor holds 1 USPTO granted patent. Top assignee: Boston Semi Equipment LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Ostendorf. Retrieved from https://idiyas.com/inventor/david-ostendorf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Ostendorf and Voltage-Isolation Testing

Introduction

David Ostendorf is an inventor associated with Hudson, Wisconsin, and Boston Semi Equipment LLC. His patent work addresses equipment for testing electrical devices under controlled conditions.

Latest Patents

The provided information identifies one patent associated with Ostendorf: Contactor for Voltage Isolation and Breakdown Testing. The invention describes a contactor and method for testing a device’s breakdown voltage. Its test site uses multiple electrical contacts to connect with the device. Two housing portions selectively engage to form a closed chamber around the test site, and a gas inlet supplies pressurized gas to the chamber. This design supports breakdown-voltage testing in a pressurized environment. Ostendorf is credited with 1 patent in the information provided.

Career Highlights

Ostendorf’s listed invention focuses on semiconductor test equipment and voltage-isolation procedures. The contactor’s enclosed, pressurizable chamber is a central feature of the disclosed testing approach.

Collaborations

The provided information lists Stephen Johnson and Daniel Mariano as Ostendorf’s coworkers at Boston Semi Equipment LLC. It does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

David Ostendorf’s identified patent presents a pressurized contactor design for breakdown-voltage testing, reflecting his connection to semiconductor test equipment innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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