Harrow, United Kingdom

David Nathaniel Alleyne

This inventor holds 1 USPTO granted patent. Top assignee: Imperial College of Science, Technology and Medicine. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Nathaniel Alleyne. Retrieved from https://idiyas.com/inventor/david-nathaniel-alleyne

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: David Nathaniel Alleyne: Innovator in Pipe Inspection Technology

Introduction

David Nathaniel Alleyne is a notable inventor based in Harrow, GB. He has made significant contributions to the field of pipe inspection technology. His innovative approach has led to the development of a patent that enhances the efficiency and effectiveness of inspecting pipes.

Latest Patents

David holds a patent for the "Inspection of Pipes." This invention represents a crucial advancement in ensuring the integrity and safety of piping systems. With 1 patent to his name, he has demonstrated his capability to innovate within his field.

Career Highlights

David is affiliated with the Imperial College of Science, Technology and Medicine. His work at this prestigious institution has allowed him to collaborate with leading experts and contribute to groundbreaking research in engineering and technology.

Collaborations

Throughout his career, David has worked alongside talented colleagues such as Peter Cawley and Che Wan Chan. These collaborations have enriched his research and have led to further advancements in the field of pipe inspection.

Conclusion

David Nathaniel Alleyne is a dedicated inventor whose work in pipe inspection technology has made a significant impact. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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