Milton, MA, United States of America

David N Skinner

This inventor holds 1 USPTO granted patent. Top assignee: The Foxboro Company. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David N Skinner. Retrieved from https://idiyas.com/inventor/david-n-skinner-viqxmjqb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: David N. Skinner and His Sensor for Electrometric Measurement.

Introduction

David N. Skinner is an inventor associated with Milton, Massachusetts, and The Foxboro Company. His patent work addresses sensor design for measuring ion concentrations in process solutions.

Latest Patents

Skinner is credited with 1 patent: “Sensor for Electrometric Measurement.” The invention features a reference electrode and a flowing electrolyte, supplied by a pressurized reservoir. It also includes a non-metallic solution ground and a resistance temperature device bonded to that ground. The design aims to improve measurement accuracy and stability by minimizing or preventing contaminants from entering through the sensor’s external junction.

Career Highlights

Skinner’s recorded patent is focused on practical instrumentation for process-solution measurement. Its combination of controlled electrolyte flow, a non-metallic solution ground, and temperature sensing is intended to support reliable operation.

Collaborations

Skinner’s listed coworkers include Kenneth S. Fletcher and Ellen Candela. The patent information provided identifies The Foxboro Company as his company.

Conclusion

David N. Skinner’s patent describes a sensor designed to deliver more accurate and stable electrometric measurements by limiting contamination at the sensor junction.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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