This inventor holds 1 USPTO granted patent. Top assignee: Psc Scanning, Inc.. Active years: 2001.
Company Filing History:
Years Active: 2001
Title: The Innovative Contributions of David N Ruff
Introduction
David N Ruff is an accomplished inventor based in Sherwood, Oregon. He has made significant contributions to the field of data reading technology. His innovative approach has led to the development of a unique patent that enhances the efficiency and durability of scanning systems.
Latest Patents
David N Ruff holds a patent for a "Pinless dithering assembly for data reading." This invention presents a scanning system and method of data reading that incorporates a compact and easy-to-assemble dithering assembly. The design is specifically configured to protect delicate scanning components, such as flexures, from damage caused by external mechanical shock. The preferred construction of the dithering assembly includes a dither mount and a mirror mount, each equipped with an arm that is designed to engage one another. Notably, the dither mount arm features a socket that receives a ball member protruding from the mirror mount arm. This innovative design enhances the overall functionality and reliability of scanning systems.
Career Highlights
David N Ruff has dedicated his career to advancing technology in the scanning industry. He is currently associated with Psc Scanning, Inc., where he continues to innovate and develop new solutions. His work has not only contributed to his company but has also had a broader impact on the field of data reading technology.
Collaborations
Throughout his career, David has collaborated with talented individuals such as James J Jensen and Christopher F Sautter. These collaborations have fostered an environment of creativity and innovation, leading to advancements in their respective projects.
Conclusion
David N Ruff's contributions to the field of data reading technology exemplify the spirit of innovation. His patent for the pinless dithering assembly showcases his commitment to enhancing the efficiency and durability of scanning systems. Through his work and collaborations, he continues to make a significant impact in the industry.