Ithaca, NY, United States of America

David N Agyeman-Budu

This inventor holds 1 USPTO granted patent. Top assignee: Cornell University. Active years: 2022.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: David N Agyeman-Budu: Innovator in X-ray Filter Technology

Introduction

David N Agyeman-Budu is an accomplished inventor based in Ithaca, NY (US). He has made significant contributions to the field of x-ray technology, particularly with his innovative high-pass x-ray filter device. His work is instrumental in advancing the capabilities of x-ray imaging systems.

Latest Patents

Agyeman-Budu holds a patent for a high-pass x-ray filter device and methods of making thereof. This device includes a substrate that defines an elongated opening. A reflecting membrane is positioned across the opening and is supported by the substrate on all sides. The reflecting membrane is designed to transmit x-ray photons with energy above a certain threshold while reflecting those with energy below that threshold. The elongated opening allows for an exit path for the transmitted x-ray beam. This invention enhances the efficiency and effectiveness of x-ray imaging.

Career Highlights

David N Agyeman-Budu is affiliated with Cornell University, where he continues to engage in research and development in the field of x-ray technology. His work has garnered attention for its innovative approach and practical applications in medical imaging and other areas.

Collaborations

Some of his notable coworkers include Joel D Brock and Arthur R Woll. Their collaboration has contributed to the advancement of research and development in their respective fields.

Conclusion

David N Agyeman-Budu is a notable inventor whose work in x-ray filter technology has the potential to significantly impact the field of imaging. His innovative contributions continue to pave the way for advancements in medical and industrial applications.

Profile summary based on public USPTO records.
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