This inventor holds 1 USPTO granted patent. Top assignee: Princeton University. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: David Miller - Innovator in Optical Trace Gas Sensing
Introduction
David Miller is an accomplished inventor based in Princeton, NJ (US). He has made significant contributions to the field of optical trace gas sensing. His innovative work has led to the development of a unique spectroscopic sensor that enhances the accuracy of gas concentration measurements.
Latest Patents
David Miller holds a patent for a "Multi-harmonic inline reference cell for optical trace gas sensing." This invention involves a spectroscopic sensor and method for determining the concentration of a sample. The sensor operates with a coherent light source that transmits an interrogation light beam along an optical sample path directed towards the sample. It features an in-line reference cell located in the sample path, along with a detector that responds to absorption signals from both the sample and the reference cell. A processor is included to isolate reference absorption signals and generate calibration information, ultimately determining the concentration of the sample based on the absorption signals.
Career Highlights
David Miller is affiliated with Princeton University, where he continues to advance research in optical sensing technologies. His work has garnered attention for its potential applications in various fields, including environmental monitoring and industrial processes.
Collaborations
Some of his notable coworkers include Kang Sun and Mark A Zondlo, who have collaborated with him on various research projects.
Conclusion
David Miller's contributions to optical trace gas sensing exemplify the impact of innovative thinking in scientific research. His patented technology represents a significant advancement in the field, showcasing his dedication to improving measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
