Winchester, MA, United States of America

David Michael Vaccaro

This inventor holds 1 USPTO granted patent. Top assignee: Canon U.s.a., Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Michael Vaccaro. Retrieved from https://idiyas.com/inventor/david-michael-vaccaro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: David Michael Vaccaro and Patent Innovation in Medical Imaging.

Introduction

David Michael Vaccaro is an inventor based in Winchester, Massachusetts. His work includes a patented approach to presenting stenosis measurements alongside optical-imaging views of a lumen. He is associated with Canon U.S.A., Inc.

Latest Patents

Vaccaro is credited with 1 patent: “Devices, Systems, and Methods for Displaying Stenosis Measurements and Calculations.” The invention calculates a stenosis measurement for a selected location in a lumen using optical-imaging data and a reference location. It generates a screen with tomographic and longitudinal views, along with indicators marking the measured and reference locations in both views.

Career Highlights

The patent describes a way to bring measurements and corresponding imaging views together in one display. By identifying the measured and reference locations across both views, the system is designed to help users interpret stenosis calculations in the context of the underlying optical-imaging data.

Collaborations

Vaccaro’s listed coworkers include Jacob Schieffelin Brauer and Rohini Deb. His association with Canon U.S.A., Inc. places his patent work within a company active in imaging technologies.

Conclusion

David Michael Vaccaro’s patent focuses on presenting lumen imaging and stenosis measurements in a coordinated, clearly marked display, reflecting an innovation in medical-imaging visualization.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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