David McKnight

Title: David McKnight: Innovator in Light Scattering Measurements

Introduction

David McKnight is a notable inventor based in Coventry, GB. He has made significant contributions to the field of particle measurement technology. His innovative work focuses on methods and apparatus for measuring particle characteristics through light scattering measurements.

Latest Patents

David McKnight holds a patent for "Light scattering measurements using simultaneous detection." This patent describes methods and apparatus for measuring particle characteristics. In one aspect, it involves detecting an amount of light arising from the interaction between light and a suspended sample. This detection occurs simultaneously with the acquisition of a photon count from a different direction. At least one measure of particle characteristics can then be derived based at least in part on the timing between information from the steps of acquiring and detecting.

Career Highlights

David McKnight is currently employed at Malvern Panalytical Inc., where he continues to develop innovative technologies in particle measurement. His work has been instrumental in advancing the capabilities of light scattering techniques.

Collaborations

David has collaborated with notable colleagues such as Fraser McNeil-Watson and Malcolm Connah. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

David McKnight's contributions to light scattering measurements exemplify the importance of innovation in scientific research. His work continues to influence the field and enhance our understanding of particle characteristics.