The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Jan. 15, 2009
Applicants:
Fraser Mcneil-watson, Malvern, GB;
Malcolm Connah, Malvern, GB;
Robert Jack, Bromsgrove, GB;
David Mcknight, Coventry, GB;
Inventors:
Fraser McNeil-Watson, Malvern, GB;
Malcolm Connah, Malvern, GB;
Robert Jack, Bromsgrove, GB;
David McKnight, Coventry, GB;
Assignee:
Malvern Panalytical Limited, Malvern, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01N 15/1427 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/0096 (2013.01);
Abstract
Methods and apparatus for measuring particle characteristics are disclosed. In one aspect, an amount of light arising from interaction between light and a suspended sample is detected simultaneously with the acquisition of a photon count from a different direction. At least one measure of particle characteristics can then be derived based at least in part on timing between information from the steps of acquiring and detecting.