San Jose, CA, United States of America

David Mark William Byard

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Vmware, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Mark William Byard. Retrieved from https://idiyas.com/inventor/david-mark-william-byard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: David Mark William Byard: Inventor of a Runtime Extension System

Introduction

David Mark William Byard is an inventor based in San Jose, California. His patent work addresses how bundled web applications can be extended while running.

Latest Patents

Byard is associated with 1 patent: “Runtime Extension System for Bundled Web Application.” The invention describes a container application that registers reusable portions of its code in a global context during startup. Loaded extensions, which are themselves bundled web applications, can then access and use those portions as though they had been included in the original application. The system also describes managing extensions through scopes and permissions, including controls based on application mode and user allowlists.

Career Highlights

Byard is associated with VMware, Inc. His patent reflects work on application extensibility and mechanisms for controlling how extensions are accessed and used.

Collaborations

Jeffrey Moroski is identified as Byard’s coworker. The available information does not specify their roles in the patent or any particular collaboration.

Conclusion

David Mark William Byard’s patent presents an approach to extending bundled web applications at runtime while providing controls for extension access and use.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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