Location History:
- Braddon, ACT 2601, AU (2003)
- Braddon, AU (2007)
Company Filing History:
1 out of 641 
1 out of 832,843 Years Active: 2003-2007
Title: David M W Evans: Innovator in Defect Detection Technology
Introduction
David M W Evans is a notable inventor based in Braddon, Australia. He has made significant contributions to the field of defect detection technology, holding 2 patents that showcase his innovative approach to image analysis.
Latest Patents
One of his latest patents is an "Inspection method and apparatus for the inspection of either random or repeating patterns." This invention presents a hybrid technique for identifying defects on digitized device images by utilizing a combination of spatial domain and frequency domain techniques. The method involves finding the two-dimensional spectra of two images using Fourier-like transforms. Strong harmonics in the spectra are removed with a consistent spectral filter applied to both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. This hybrid technique results in a high-performance and flexible defect detection system, excelling in both array and random devices. It effectively addresses challenges such as shading variations and the dark-bright problem, which are often difficult for other techniques to manage. Additionally, the frequency domain techniques used for image alignment yield fewer errors compared to spatial domain techniques of similar complexity. The method for determining the relative offsets of image pairs is also noted for its accuracy and cost-effectiveness.
Career Highlights
Throughout his career, David has worked with various companies, including Kla-Tencor Technologies Corporation. His experience in the industry has allowed him to refine his skills and contribute to advancements in defect detection technology.
Collaborations
David has collaborated with notable professionals in his field, including Bin-Ming Ben Tsai and Jason Z Lin. These collaborations have further enriched his work and contributed to the development of innovative solutions in image analysis.
Conclusion
David M W Evans is a distinguished inventor whose work in defect detection technology has made a significant impact. His innovative methods and collaborations continue to influence the field, showcasing the importance of advancements in image analysis.