Oxfordshire, United Kingdom

David M Guyoncourt

This inventor holds 1 USPTO granted patent. Top assignee: Bnf Metals Technology Centre. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David M Guyoncourt. Retrieved from https://idiyas.com/inventor/david-m-guyoncourt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1990

Loading Chart...
1 patent (USPTO):Explore Patents

Title: David M Guyoncourt: Innovator in Surface-Temperature Sensing Technology

Introduction

David M Guyoncourt is a notable inventor based in Oxfordshire, GB. He has made significant contributions to the field of temperature sensing technology. His innovative approach has led to the development of a unique apparatus designed for measuring the surface temperature of moving strips at elevated temperatures.

Latest Patents

David holds a patent for a "Surface-temperature sensing method and apparatus." This invention features a sensing head connected to a pneumatic actuator through a ball joint. The apparatus utilizes air under pressure, which flows through a series of passages to create an air cushion between the sensing head and the surface whose temperature is being measured. A thermocouple measures the temperature of the air flowing across the surface, providing an accurate reading of the surface temperature.

Career Highlights

David M Guyoncourt is associated with BNF Metals Technology Centre, where he applies his expertise in temperature sensing technology. His work at the center has allowed him to further develop and refine his inventions, contributing to advancements in the field.

Collaborations

(Section skipped due to space constraints.)

Conclusion

David M Guyoncourt's innovative work in surface-temperature sensing technology exemplifies the impact of dedicated inventors in advancing industrial applications. His patent reflects a significant step forward in the accuracy of temperature measurement methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…