David M Geary

Introduction

David M Geary is an accomplished inventor based in Natick, Massachusetts. With one patented innovation to his name, he has made significant contributions to the field of yarn measurement technology.

Latest Patents

David's notable patent, titled "Moisture Corrected Denier Measurement," addresses the need for accurate measurements of yarn denier using capacitance transducers. This innovative method involves automatically correcting measurements for moisture content. By testing yarn samples at different moisture levels and frequencies with two capacitance transducers, David discovered that the difference in apparent denier outputs is proportional to moisture content. This discovery allows for more accurate readings by adding the differences to measured values, further refined through factors derived from slope curves of transducer output versus moisture levels.

Career Highlights

David is affiliated with Microsensors Corporation, where he works to advance technologies related to sensor measurements. His expertise in capacitance and yarn measurements has positioned him as a key figure in his field.

Collaborations

Throughout his career, David has collaborated closely with his coworker, John S Piso. Together, they share a commitment to enhancing the accuracy of yarn measurement technologies and advancing the capabilities of measurement tools used in the textile industry.

Conclusion

David M Geary stands out as an innovative inventor whose work on moisture corrected denier measurement is significant for the textile industry. His patents and collaborations continue to inspire advancements in measurement technology, ensuring more precise results in yarn assessments.