Amherst, NH, United States of America

David M Darling


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of David M. Darling

Introduction

David M. Darling is an accomplished inventor based in Amherst, NH (US). He is known for his significant contributions to the field of semiconductor technology. With a focus on automated measurement systems, his work has paved the way for advancements in the industry.

Latest Patents

David M. Darling holds a patent for an "Apparatus for automatically measuring the resistivity of semiconductor boules by using the method of four probes." This innovative apparatus is designed for the automated measurement and recording of the electrical resistivity of semiconductor boules or ingots. It utilizes a four-point boule support grid positioned adjacent to a four-tip probe, which features three-axis linear mobility and rotational capability. The system is computer-controlled, allowing for automated mapping and testing of semiconductor boules, whether they are "as grown" or ground with cropped ends. This invention is crucial for obtaining and recording resistivity data efficiently.

Career Highlights

David M. Darling is currently employed at G.T. Equipment Technologies, Inc., where he continues to develop and refine technologies related to semiconductor measurement. His expertise in this area has made him a valuable asset to the company and the industry as a whole.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Mohan Chandra and L. Dolan Roman. These partnerships have contributed to the advancement of technology in their field.

Conclusion

David M. Darling's innovative work in semiconductor technology, particularly his patented apparatus for measuring resistivity, showcases his dedication to advancing the industry. His contributions continue to influence the field and highlight the importance of automation in semiconductor measurement.

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