This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignees: Miles Laboratories, Inc., Schlumberger Industries. Active years: 1988-1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1988-1990
Title: David M Cooper: Innovator in Calibration Technology
Introduction
David M Cooper is a notable inventor based in Duluth, GA (US). He has made significant contributions to the field of calibration technology, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of measurement devices.
Latest Patents
One of his latest patents is titled "Adjustment circuit and method for solid-state electricity meter." This invention involves a calibration circuit for a solid-state electricity meter that comprises a plurality of resistors formed on an integrated circuit. The resistors are connected by an on-chip array of electrically controlled switches, such as MOSFETs, to signal processing circuitry driving the meter. The resistors establish variable voltage divider networks that compensate the meter for phase, gain, and offset errors distributed in the signal processing circuitry. The values of the variable voltage divider network may be established automatically during testing of the meter, by a digital computer, or semi-automatically, by a technician, to establish the 'on' and 'off' states of the various transistors of the array.
Another significant patent is the "Method of calibrating reflectance measuring devices." This method is designed for reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a secondary reflectance standard for several wavelengths are calculated and stored in a memory of a reflectance measuring device. A secondary standard is mounted in the reflectance measuring device, and reflectances at selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate the true reflectance of the test sample.
Career Highlights
David has worked with prominent companies such as Schlumberger Industries, Inc. and Miles Laboratories, Inc. His experience in these organizations has contributed to his expertise in calibration technologies and measurement devices.
Collaborations
Throughout his career, David has collaborated with talented individuals, including Ferrokh Khandaghabadi and Ralph S Hernicz. These collaborations have further enriched his work and innovations in the field.
Conclusion
David M Cooper is a distinguished inventor whose contributions to calibration technology have made a significant impact. His patents reflect his commitment to improving measurement accuracy and efficiency
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
