Rochester, NY, United States of America

David Lee Johnson

This inventor holds 1 USPTO granted patent. Top assignee: Ortho-Clinical Diagnostics, Inc. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Lee Johnson. Retrieved from https://idiyas.com/inventor/david-lee-johnson-lw6py3tt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of David Lee Johnson

Introduction

David Lee Johnson is a notable inventor based in Rochester, NY (US). He has made significant contributions to the field of measurement technology, particularly through his innovative patent that addresses the challenges of cuvette stability during analysis.

Latest Patents

Johnson holds a patent for a device and method aimed at stabilizing a cuvette during measurement. This invention enhances precision by reducing lateral movement of the cuvette during the measurement process. The device features a fixed support on one side of the cuvette path that abuts the cuvette without interfering with its optical window. Additionally, a movable support on the opposite side is biased against the cuvette, ensuring stability while allowing for accurate readings.

Career Highlights

David Lee Johnson is currently employed at Ortho-Clinical Diagnostics, Inc., where he applies his expertise in measurement technology. His work focuses on developing solutions that improve the accuracy and reliability of diagnostic measurements.

Collaborations

Johnson collaborates with talented coworkers, including Merrit Nyles Jacobs and Robert Anthony Burkovich, who contribute to the innovative environment at Ortho-Clinical Diagnostics, Inc.

Conclusion

David Lee Johnson's contributions to measurement technology through his patent demonstrate his commitment to innovation and precision in diagnostics. His work continues to impact the field positively, showcasing the importance of stability in measurement processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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