Round Rock, TX, United States of America

David L Smith

This inventor holds 1 USPTO granted patent. Top assignee: Luminex Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David L Smith. Retrieved from https://idiyas.com/inventor/david-l-smith-9w68invo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: David L. Smith: Innovator in Measurement Systems

Introduction

David L. Smith is an accomplished inventor based in Round Rock, TX (US). He holds a patent for innovative systems and methods designed for performing measurements of one or more materials. His work contributes significantly to the field of measurement technology.

Latest Patents

David L. Smith has been granted 1 patent for his invention titled "Systems and methods for performing measurements of one or more materials." This patent outlines a system that is configured to transfer materials to an imaging volume of a measurement device from storage vessels. It also includes systems for imaging and immobilizing materials within the measurement device, enhancing the accuracy and efficiency of measurements.

Career Highlights

David is currently employed at Luminex Corporation, where he applies his expertise in measurement systems. His role at the company allows him to further develop and refine his innovative ideas in a collaborative environment.

Collaborations

Some of David's notable coworkers include Wayne Dennis Roth and Charles J. Collins. Their collaboration fosters a creative atmosphere that encourages the development of cutting-edge technologies.

Conclusion

David L. Smith's contributions to measurement systems exemplify the spirit of innovation. His patent and work at Luminex Corporation highlight his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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