David L Erickson

Title: Innovations by David L. Erickson

Introduction

David L. Erickson is an accomplished inventor based in Rochester, MN (US). He is known for his contributions to optical inspection systems, particularly in the field of monitoring surface structures. His innovative approach has led to the development of a unique system that enhances the accuracy of surface inspections.

Latest Patents

One of Erickson's notable patents is the "Optical inspection system utilizing wedge shaped spatial filter." This invention includes a system for monitoring surface structures on a planar surface using a radiation source that emits a beam. The system is designed to handle various surface structure types, including grooves that intersect at specific angles. The apparatus directs the beam to the planar surface along an optical axis, resulting in scattered radiation and a reference beam being reflected. A detector responds to the scattered radiation, producing a signal that is filtered to allow only selected surface structures to reach the detector. This innovative design enhances the precision of surface inspections.

Career Highlights

David L. Erickson is associated with the International Business Machines Corporation (IBM), where he has made significant contributions to the field of optical inspection. His work has been instrumental in advancing technologies that improve the quality and reliability of surface inspections in various applications.

Collaborations

Throughout his career, Erickson has collaborated with notable colleagues, including Arlen John Bowen and Venkat R. Koka. These collaborations have fostered innovation and have contributed to the development of advanced technologies in the field.

Conclusion

David L. Erickson's contributions to optical inspection systems exemplify the impact of innovative thinking in technology. His patent and work at IBM highlight the importance of precision in monitoring surface structures.