Raton, NM, United States of America

David L Baldridge


Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1988-1993

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of David L Baldridge

Introduction

David L Baldridge is a notable inventor based in Raton, New Mexico. He has made significant contributions to the field of material thickness measurement, holding three patents that showcase his innovative approach. His work is particularly relevant in applications where precise measurements are critical, such as in aviation and geotechnical engineering.

Latest Patents

One of Baldridge's latest patents is a method for controlling the thickness of a layer of material in a seam. This method utilizes a microstrip antenna as a thickness measuring sensor. The sensor is positioned over the layer, and a value for a parameter of the antenna, such as conductance or resonant frequency, is measured. This value is then compared to a calibration table to determine the thickness of the layer through interpolation. This technology can be crucial for detecting ice buildup on aircraft wings or identifying buried explosive devices.

Another significant patent by Baldridge is a method and apparatus for measuring the thickness of a layer of geologic material. Similar to his previous invention, this method employs a microstrip antenna to measure the thickness of materials like soil, wood, ice, or coal. The process involves measuring a parameter of the antenna and comparing it to a control value to initiate a decision-making process regarding the material's thickness.

Career Highlights

David L Baldridge is associated with Stolar, Inc., where he continues to develop innovative solutions in material measurement. His work has garnered attention for its practical applications and potential to enhance safety in various industries.

Collaborations

Baldridge has collaborated with notable colleagues, including Larry G Stolarczyk and Gerald Lee Stolarczyk. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

David L Baldridge's innovative patents and contributions to material thickness measurement highlight his role as a significant inventor in the industry. His work not only advances technology but also enhances safety in critical applications.

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