The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1993

Filed:

Sep. 11, 1991
Applicant:
Inventors:

Larry G Stolarczyk, Raton, NM (US);

Gerald L Stolarczyk, Raton, NM (US);

David L Baldridge, Raton, NM (US);

Assignee:

Stolar, Inc., Raton, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21C / ;
U.S. Cl.
CPC ...
299-12 ; 324332 ;
Abstract

A method for determining the thickness of a layer of material, such as soil, wood, ice or coal, that utilizes a microstrip antenna as a thickness measuring sensor. The sensor is positioned over the layer and a value for a parameter of the antenna such as conductance or resonant frequency is measured. The value is compared to a calibration table of values and the thickness of the layer is determined by interpolation. Alternatively, the value is compared to a control value to initiate a decision process. The decision could be that a layer of ice is building up on a wing of an aircraft or that an explosive device is buried under a layer of soil.


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