This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2003-2004.
Company Filing History:
Years Active: 2003-2004
Title: Innovations by David John Iverson
Introduction
David John Iverson is an accomplished inventor based in Underhill, Vermont. He has made significant contributions to the field of electronic testing and integrated circuits. With a total of 2 patents, Iverson's work focuses on improving the reliability and efficiency of electronic devices.
Latest Patents
Iverson's latest patents include a "System and method to predetermine a bitmap of a self-tested embedded array" and a "Method and system for determining common failure modes for integrated circuits." The first patent describes a built-in self-test (BIST) system that tests an array of embedded electronic devices. This system generates a unique signature in response to failure indications, allowing for efficient testing without the need for bitmap analysis when known failure signatures are identified. The second patent outlines a method for determining common failure modes in integrated circuits by applying test patterns and comparing output data to expected results. This innovative approach enhances the testing process and aids in identifying potential failures.
Career Highlights
David John Iverson is currently employed at International Business Machines Corporation (IBM), where he continues to develop and refine his inventions. His work at IBM has allowed him to collaborate with other talented professionals in the field, further advancing the technology surrounding electronic devices.
Collaborations
Some of Iverson's notable coworkers include David V Gangl and Matthew Sean Grady. Their collective expertise contributes to the innovative environment at IBM, fostering advancements in electronic testing and integrated circuit design.
Conclusion
David John Iverson's contributions to the field of electronic testing and integrated circuits demonstrate his commitment to innovation. His patents reflect a deep understanding of the challenges faced in electronic device reliability, and his work continues to influence the industry positively.