Amersham, United Kingdom

David John Dwight

This inventor holds 1 USPTO granted patent. Top assignee: The Radiochemical Centre Limited. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David John Dwight. Retrieved from https://idiyas.com/inventor/david-john-dwight

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: David John Dwight - Innovator in Ionization Detection

Introduction

David John Dwight is a notable inventor based in Amersham, GB. He has made significant contributions to the field of ionization detection, particularly through his innovative patent. His work has implications for various applications in science and technology.

Latest Patents

David John Dwight holds a patent for a novel form of ionization detector. This detector operates in the electron capture mode and utilizes iron-55 as a source of electrons to induce ionization. The design allows the detector to function in direct current, pulse, or frequency modulated modes, showcasing its versatility and effectiveness.

Career Highlights

David is associated with The Radiochemical Centre Limited, where he applies his expertise in developing advanced detection technologies. His work at the company has positioned him as a key figure in the field of radiochemistry and ionization detection.

Collaborations

David has collaborated with Edgar Adolf Lorch, contributing to the advancement of ionization detection technologies. Their partnership has fostered innovation and development in this specialized area.

Conclusion

David John Dwight's contributions to ionization detection highlight his role as an influential inventor. His innovative patent and collaboration with notable colleagues underscore the importance of his work in advancing detection technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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