Oceanside, CA, United States of America

David John Ditri

This inventor holds 1 USPTO granted patent. Top assignee: Unisys Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David John Ditri. Retrieved from https://idiyas.com/inventor/david-john-ditri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of David John Ditri

Introduction

David John Ditri is a notable inventor based in Oceanside, CA (US). He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique patent that enhances the reliability of integrated circuit testers.

Latest Patents

David John Ditri holds a patent for an "Integrated circuit tester having a fail-safe mechanism for moving IC-chips." This invention includes a fail-safe mechanism that ensures the safe movement of integrated circuit chips between their initial and test positions. The design incorporates a motor and a shaft that the motor rotates to facilitate this movement. Additionally, an electronic control circuit can automatically stop the motor when the chip reaches either position. In the event of a control circuit failure, the fail-safe mechanism prevents damage to the integrated circuit tester.

Career Highlights

David is currently employed at Unisys Corporation, where he continues to innovate and contribute to advancements in technology. His work focuses on improving the efficiency and safety of electronic testing equipment.

Collaborations

Some of his notable coworkers include Ronald Allen Norell and James Mason Brafford. Their collaborative efforts contribute to the innovative environment at Unisys Corporation.

Conclusion

David John Ditri's contributions to integrated circuit testing exemplify the importance of innovation in technology. His patent reflects a commitment to enhancing the reliability and safety of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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