Ottawa, Canada

David James Reny

This inventor holds 1 USPTO granted patent. Top assignee: Fiery, LLC. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David James Reny. Retrieved from https://idiyas.com/inventor/david-james-reny

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Biography of David James Reny

Introduction: David James Reny is an innovative inventor based in Ottawa, Canada. He has made significant contributions to the field of digital printing technologies, particularly in the area of printing white underbase images.

Latest Patents: David holds a patent for a "Method and system for underbase with highlight white." This patent outlines techniques for printing white underbase image data and highlight white image data in a single pass using digital printing technologies. The methods involve enhancing the white ink in areas of the image that are white or near white by combining the white underbase image data with the white ink image data.

Career Highlights: David has built a successful career at Fiery, LLC, where he has applied his expertise in digital printing. His work has been instrumental in advancing the capabilities of printing technologies, making them more efficient and effective.

Collaborations: Throughout his career, David has collaborated with various professionals in the industry, including his coworker David John Evans. Together, they have worked on projects that push the boundaries of digital printing.

Conclusion: David James Reny is a notable inventor whose work has had a lasting impact on the digital printing industry. His innovative patent and collaborative efforts continue to inspire advancements in printing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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