David J Whitehouse

Title: The Innovative Mind of David J. Whitehouse

Introduction: David J. Whitehouse, an accomplished inventor based in Melton Mowbray, GB, has made significant contributions to the field of surface measurement technology. With a total of five patents to his name, his work showcases innovative methods and techniques that have the potential to revolutionize how surfaces are characterized and measured.

Latest Patents: Whitehouse's latest patents include a groundbreaking method for determining the coordinates of the center of curvature of a workpiece. This method simplifies the process by deriving sensor signals from only three points along the sensor's traverse, eliminating the need for constraints on the position or symmetry of those points. By doing so, it allows the application of the method on workpieces with partial arcs. The output of this method produces x and y coordinate signals that are derived from the angular positions of the points and the sensor signals.

Another notable patent addresses surface measurement technology by providing a method for deriving commonly used parameters that characterize surfaces. This innovative approach involves computing the autocorrelation function of a surface signal and selectively utilizing its values alongside the sampling interval. This simplification allows for effective microprocessor techniques to be employed in parameter computation, enhancing the efficiency of surface evaluations.

Career Highlights: David J. Whitehouse is a key contributor at The Rank Organisation Plc, where he applies his inventive expertise to the field. His focus on advancing surface measurement technology has established him as a respected figure in his industry.

Collaborations: Throughout his career, Whitehouse has collaborated with talented coworkers such as John Jungles and Harish C. Sharma. These collaborations have fostered an environment of creativity and innovation, leading to the development of advanced methods that push the boundaries of surface measurement.

Conclusion: David J. Whitehouse exemplifies the spirit of innovation in the realm of surface measurement technology. His patents highlight a commitment to simplifying complex processes and advancing industry practices. As he continues to contribute to his field, his work will undoubtedly inspire future innovations and advancements.