Ocoee, FL, United States of America

David J Shelton

This inventor holds 1 USPTO granted patent. Top assignee: Bae Systems Information and Electronic Systems Integration Inc.. Active years: 2023.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: David J Shelton - Innovator in Infrared Camera Technology

Introduction

David J Shelton is a notable inventor based in Ocoee, Florida. He has made significant contributions to the field of infrared camera technology, particularly with his innovative patent that enhances the performance of infrared detectors.

Latest Patents

David J Shelton holds a patent for a "Luminescent cold shield paneling for infrared camera continuous non-uniformity correction." This invention features a luminescent diode surface within the cold shield of an infrared camera. It allows for continuous non-uniformity correction with uniform irradiance across an infrared IR detector array. The inclusion of a luminescent diode surface enables the adjustment of diode bias, providing a negative luminescent effect with reverse bias and an electro-luminescent effect with forward bias. This innovation facilitates multiple set points for continuous offset and gain correction, addressing non-linear response effects.

Career Highlights

David is currently employed at BAE Systems Information and Electronic Systems Integration Inc. His work focuses on advancing technologies that improve the functionality and accuracy of infrared cameras.

Collaborations

He collaborates with talented coworkers, including Jeremy B Reeves and Steven R Jost, who contribute to the innovative environment at BAE Systems.

Conclusion

David J Shelton's contributions to infrared camera technology exemplify the impact of innovation in enhancing imaging systems. His work continues to influence advancements in the field, showcasing the importance of continuous improvement in technology.

Profile summary based on public USPTO records.
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