Henniker, NH, United States of America

David J Plunkett

This inventor holds 1 USPTO granted patent. Top assignee: Autodesk, Inc.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David J Plunkett. Retrieved from https://idiyas.com/inventor/david-j-plunkett

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: David J. Plunkett: Inventor of a CAD Data-Reordering Tool

Introduction

David J. Plunkett is an inventor associated with Henniker, New Hampshire, and Autodesk, Inc. His patent work addresses a practical challenge in computer-aided design: changing the sequence of data values assigned to graphical objects.

Latest Patents

Plunkett is credited with 1 patent: “Graphic Interactive Method to Reorder Sequential Data Values on Graphic Objects.” The invention describes a reordering tool for sequentially rearranging data values assigned to graphical objects in a CAD model. The tool may be a standalone software application or part of another application, and its graphical user interfaces can receive user input and present information before the values are reordered.

Career Highlights

Plunkett’s patented work is connected to Autodesk, Inc., a company known for software used in design and engineering. His invention focuses on making the organization of sequential data in CAD models more interactive.

Collaborations

Plunkett’s listed coworkers include Scott Anthony Arvin and Marc Wagner Schindewolf. Their inclusion provides context for the professional network associated with his work.

Conclusion

David J. Plunkett’s patent documents an interactive approach to reordering data assigned to CAD objects, reflecting a focused contribution to design software tools.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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