This inventor holds 1 USPTO granted patent. Top assignee: Yale University. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: David J Leffell: Innovator in Skin Evaluation Technology
Introduction
David J Leffell is a notable inventor based in Ann Arbor, MI (US). He has made significant contributions to the field of dermatology through his innovative patent. His work focuses on the evaluation of skin characteristics, particularly in relation to aging and ultraviolet exposure.
Latest Patents
David J Leffell holds a patent for an "Optical method and apparatus for detecting and measuring aging." This invention involves a method and apparatus for inducing fluorescence in human skin, in vivo, and for evaluating certain skin characteristics from the spectral intensity of the induced fluorescence. The technology utilizes a helium-cadmium laser directed at a skin area, with a fiberoptic element facilitating the evaluation. The induced fluorescent energy is analyzed to develop a ratio of characteristic portions of fluorescent intensity, which can indicate differences in skin characteristics between subjects of varying ages.
Career Highlights
Leffell's career is marked by his association with Yale University, where he has contributed to research and development in skin evaluation technologies. His innovative approach has paved the way for advancements in understanding skin aging and the effects of ultraviolet radiation.
Collaborations
David J Leffell has collaborated with Lawrence I Deckelbaum, further enhancing the research and development of skin evaluation methods. Their combined expertise has contributed to the advancement of technologies in this field.
Conclusion
David J Leffell's work exemplifies the intersection of innovation and healthcare, particularly in the evaluation of skin aging. His contributions have the potential to impact dermatological practices significantly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
