Hopewell, PA, United States of America

David J Hartwick

This inventor holds 1 USPTO granted patent. Top assignee: Diasense, Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David J Hartwick. Retrieved from https://idiyas.com/inventor/david-j-hartwick-g7lys8qk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of David J Hartwick

Introduction

David J Hartwick is an accomplished inventor based in Hopewell, PA (US). He has made significant contributions to the field of infrared spectroscopy. His innovative work has led to the development of a unique patent that enhances the capabilities of multichannel infrared spectroscopy systems.

Latest Patents

David holds a patent for a "Synchronous detection system for multichannel infrared spectroscopy." This invention represents a notable advancement in the technology used for analyzing infrared signals, allowing for more accurate and efficient measurements.

Career Highlights

David is currently employed at Diasense, Inc., where he continues to push the boundaries of innovation in his field. His work at Diasense, Inc. has positioned him as a key player in the development of advanced spectroscopic technologies.

Collaborations

David has collaborated with talented individuals such as Augustyn Waczynski and Mark L Hendrickson. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

David J Hartwick's contributions to the field of infrared spectroscopy exemplify the spirit of innovation. His patent and work at Diasense, Inc. highlight his commitment to advancing technology in meaningful ways.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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