David J Chapman

Title: David J Chapman: Innovator in Setup and Hold Time Characterization

Introduction

David J Chapman is a notable inventor based in Mesa, AZ (US). He has made significant contributions to the field of electronic device testing, particularly in the characterization of setup and hold times for devices under test (DUT). His innovative approach has streamlined the testing process, making it more efficient and effective.

Latest Patents

David J Chapman holds a patent for a "Setup and hold time characterization device and method." This patent describes a method of characterizing a DUT by determining a goal function associated with its setup and hold time. The process involves iteratively adjusting these times for input data to the DUT and assessing its performance against specifications. By employing a small number of binary searches, this method enhances the speed of the characterization process, ultimately reflecting minimum setup and hold time values based on the weights associated with the goal function.

Career Highlights

David is currently employed at Freescale Semiconductor, Inc., where he applies his expertise in electronic testing and characterization. His work has been instrumental in advancing the methodologies used in the industry, contributing to improved device performance and reliability.

Collaborations

David has collaborated with talented coworkers, including Yifeng Yang and Yun Zhang. Their combined efforts have fostered innovation and excellence in their projects, leading to significant advancements in their field.

Conclusion

David J Chapman is a distinguished inventor whose work in setup and hold time characterization has made a lasting impact on electronic device testing. His innovative methods continue to enhance the efficiency of the characterization process, showcasing his commitment to advancing technology.