The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Mar. 24, 2008
Yifeng Yang, Chandler, AZ (US);
Yun Zhang, Gilbert, AZ (US);
Yibin Xia, Gilbert, AZ (US);
David J. Chapman, Mesa, AZ (US);
Yifeng Yang, Chandler, AZ (US);
Yun Zhang, Gilbert, AZ (US);
Yibin Xia, Gilbert, AZ (US);
David J. Chapman, Mesa, AZ (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.