Toronto, Canada

David J C Dunn

This inventor holds 1 USPTO granted patent. Top assignee: Keanall Industries Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David J C Dunn. Retrieved from https://idiyas.com/inventor/david-j-c-dunn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: David J.C. Dunn

Introduction: David J.C. Dunn is an accomplished inventor based in Toronto, Canada, known for his innovative contributions to tool design. With a strong focus on enhancing user experience and functionality, Dunn has made significant strides in the field of tool engineering.

Latest Patents: David holds a patent for a unique tool handle that exemplifies his commitment to innovation. This invention showcases his ability to improve conventional tools, making them more ergonomic and efficient for users.

Career Highlights: Throughout his career, David has been associated with Keanall Industries Inc., where he applies his expertise in engineering and design. His work at the company reflects a dedication to advancing tool technology and meeting the needs of consumers in the market.

Collaborations: Within Keanall Industries Inc., David collaborates with talented colleagues such as Peter F.S. Welch and Darren V. Bosch. This teamwork fosters an environment of creativity and innovation, driving forward the company's mission to develop cutting-edge tools.

Conclusion: David J.C. Dunn represents the spirit of innovation in the tool industry. His patent for a tool handle, along with his collaborative efforts at Keanall Industries Inc., highlights the impact of dedicated inventors in shaping the future of functional design. As he continues his work, Dunn is sure to inspire future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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