David J Bauer

Title: David J Bauer: Innovator in Electrooptical Inspection Technology

Introduction

David J Bauer is a notable inventor based in Southfield, MI (US). He has made significant contributions to the field of electrooptical inspection technology. His innovative approach has led to the development of a unique method and apparatus that enhances the detection of defects in various articles.

Latest Patents

David J Bauer holds a patent for a "Method of and apparatus for electrooptical inspection of articles." This electrooptical system illuminates workpieces from a generally uniform source of light and performs line scanning to identify light intensity deviations that are characteristic of defects. The system utilizes pulse trains from photoelectric detectors, where the pulse magnitudes correspond to the light on discrete areas of the workpiece. Events that deviate from adaptively established signal levels are flagged as defects. The initial signals at the beginning of each scan are rejected, and the video signal is validated only after it exceeds a threshold set by a low pass filter. Data for event signals are stored, and contiguous event signals are identified as event strings. When an event string surpasses a threshold number of events, the data is compressed to facilitate storage and processing.

Career Highlights

David J Bauer is associated with Owens-Illinois Television Products Inc., where he has applied his expertise in developing advanced inspection technologies. His work has contributed to improving quality control processes in manufacturing.

Collaborations

One of his notable coworkers is Thomas F Michalski, with whom he has likely collaborated on various projects within the company.

Conclusion

David J Bauer's innovative contributions to electrooptical inspection technology demonstrate his commitment to advancing manufacturing processes. His patent reflects a significant step forward in defect detection, showcasing the importance of innovation in industry.