Fallston, MD, United States of America

David Hammond Sliney

This inventor holds 3 USPTO granted patents. Top assignees: Eyelock LLC, Other. Active years: 2012-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Hammond Sliney. Retrieved from https://idiyas.com/inventor/david-hammond-sliney

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 46(Granted Patents)


Company Filing History:


Years Active: 2012-2015

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3 patents (USPTO):Explore Patents

Title: David Hammond Sliney: Innovator in Biometric Imagery

Introduction

David Hammond Sliney is a notable inventor based in Fallston, MD, USA, with a strong focus on innovations in biometric imagery. With three patents to his name, Sliney has made significant contributions to the field, particularly in the method of capturing biometric data.

Latest Patents

Sliney's most recent patents include a groundbreaking system and method for acquiring biometric data. This innovative approach allows for the collection of biometric imagery, such as iris images, from large capture volumes. The system employs a substantially rotationally symmetric mirror, such as a cone or sphere, which is rotated at a constant velocity around a central axis.

Career Highlights

Throughout his career, David Hammond Sliney has worked with prestigious organizations, including Eyelock LLC. His expertise and inventive mindset have allowed him to push the boundaries of current technologies in biometric imagery.

Collaborations

Sliney has collaborated with talented individuals in the field, notably Keith James Hanna and George Herbert Needham Riddle. These partnerships have contributed to the development and success of his innovative projects.

Conclusion

David Hammond Sliney stands out as a significant contributor to the world of biometric technology. His inventions are paving the way for advanced methods of data acquisition, demonstrating the continuous evolution of innovation in this vital area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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