Company Filing History:
2 out of 536 
1 out of 62 Years Active: 1987-1989
Title: David H Gladstone: Innovator in Firearm Technology and Thermal Systems
Introduction
David H Gladstone is a notable inventor based in California, recognized for his contributions to firearm technology and thermal systems. With a total of 3 patents, his work reflects a commitment to innovation and practical applications in engineering.
Latest Patents
One of Gladstone's latest patents is the "Filament-wound venturi." This invention involves a venturi section or cone designed for lightweight firearms, such as recoilless guns, which can withstand high transient pressures and temperatures during firing. The venturi is constructed from a resin-impregnated multi-filament fiber material, wound on a mandrel and cured for durability. This design not only reduces the weight and cost of manufacturing but also enhances the longevity of the firearm by minimizing erosion.
Another significant patent is the "Thermo-electronic system to correct for thermal deformation." This system addresses the thermal deformation of an edge-restrained plate, allowing for quantitative monitoring and compensation of the plate's deflection. Particularly useful in military applications, this invention can improve the accuracy of gun sighting systems by compensating for temperature-induced deformations.
Career Highlights
Throughout his career, David H Gladstone has worked with various organizations, including Her Majesty the Queen in Right of Canada, as represented by the Minister. His innovative spirit and technical expertise have made a significant impact in his field.
Collaborations
Gladstone has collaborated with notable individuals such as Raymond Langlois and William J Robertson, contributing to the advancement of technology in his areas of expertise.
Conclusion
David H Gladstone's work exemplifies the intersection of innovation and practical engineering solutions. His patents in firearm technology and thermal systems demonstrate his commitment to enhancing performance and reliability in critical applications.