Somersworth, NH, United States of America

David Giroux

This inventor holds 1 USPTO granted patent. Top assignee: Qc Optics, Inc.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Giroux. Retrieved from https://idiyas.com/inventor/david-giroux-2v9gsbms

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of David Giroux

Introduction

David Giroux is an accomplished inventor based in Somersworth, NH (US). He has made significant contributions to the field of surface inspection systems. His innovative approach has led to the development of a unique patent that enhances the efficiency of these systems.

Latest Patents

David Giroux holds a patent for a "Plate holder for a surface inspection system." This invention features a plate holder body with an integral calibration plate. This design eliminates the need to load a separate special calibration plate each time the surface inspection system requires calibration. This innovation streamlines the calibration process, making it more efficient and user-friendly.

Career Highlights

David is currently employed at Qc Optics, Inc., where he applies his expertise in optical technologies. His work focuses on improving inspection systems, which are crucial in various manufacturing processes. His dedication to innovation has positioned him as a valuable asset in his field.

Collaborations

David collaborates with talented individuals such as Sergey V Broude and Abdu Boudour. These partnerships foster a creative environment that encourages the development of cutting-edge technologies.

Conclusion

David Giroux's contributions to the field of surface inspection systems exemplify the spirit of innovation. His patent and work at Qc Optics, Inc. highlight his commitment to enhancing technology in practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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