Hinckley, United Kingdom

David Garratt

This inventor holds 1 USPTO granted patent. Top assignee: The Rank Organisation Plc. Active years: 1978.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Garratt. Retrieved from https://idiyas.com/inventor/david-garratt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: The Innovations of David Garratt

Introduction

David Garratt is a notable inventor based in Hinckley, GB. He has made significant contributions to the field of measuring apparatus, particularly with stylus-type measuring instruments. His work focuses on enhancing the measurement of surface roughness and form.

Latest Patents

David Garratt holds 1 patent for his innovative measuring apparatus. This invention employs a reference body with a cylindrical or part-cylindrical surface. By probing the curved reference surface, a datum point is established. The reference body is then moved by a predetermined amount with respect to this datum, acting as a secondary reference standard.

Career Highlights

David Garratt is associated with The Rank Organisation Plc, where he has applied his expertise in measurement technology. His work has contributed to advancements in precision measurement tools, which are essential in various industrial applications.

Collaborations

David has collaborated with Graham John Siddall, enhancing the development of measuring technologies through their combined expertise.

Conclusion

David Garratt's innovative approach to measuring apparatus has made a significant impact in the field of precision measurement. His contributions continue to influence the industry and improve measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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