This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Energy Research Corporation. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: David G Walton: Innovator in Gas Permeability Measurements
Introduction
David G Walton is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of gas permeability measurements, particularly in the context of polymer film materials. His innovative approach has the potential to revolutionize testing methods in the industry.
Latest Patents
Walton holds a patent for a method and apparatus designed for measuring the permeability of polymer film materials. This invention, titled "Gas permeability measurements for film envelope materials," addresses the challenges associated with testing super-insulation powder-filled evacuated panels (PEPs). By reducing the testing time from several years to weeks or months, Walton's method utilizes a solid non-outgassing body to control the free volume of the 'body-filled panel.' The pressure versus time data obtained from the test piece allows for the extrapolation of long-term performance of candidate materials.
Career Highlights
David G Walton is currently employed at Lockheed Martin Energy Research Corporation, where he continues to apply his expertise in innovative materials and testing methods. His work has garnered attention for its practical applications and efficiency improvements in the field.
Collaborations
Walton has collaborated with esteemed colleagues such as Gerard Michael Ludtka and Thomas G Kollie. Their combined efforts contribute to advancements in research and development within their respective fields.
Conclusion
David G Walton's contributions to gas permeability measurements exemplify the impact of innovation in material science. His work not only enhances testing efficiency but also paves the way for future advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
