Munich, Germany

David Foley

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Foley. Retrieved from https://idiyas.com/inventor/david-foley-kj4o77d6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Innovations by David Foley

Introduction

David Foley is an accomplished inventor based in Munich, Germany. He has made significant contributions to the field of technology, particularly with his innovative approach to determining curvature in various applications. His work exemplifies the spirit of invention and the pursuit of knowledge.

Latest Patents

David Foley holds a patent for a "Process and device for determining the center-line of a curvature." This invention showcases his ability to address complex problems with practical solutions. The patent reflects his commitment to advancing technology and improving existing methodologies.

Career Highlights

Throughout his career, David has demonstrated a strong dedication to innovation. His work has not only contributed to his field but has also inspired others in the industry. His patent is a testament to his expertise and creativity as an inventor.

Collaborations

David Foley has collaborated with notable professionals in his field, including his coworker Dieter K Busch. These partnerships have allowed him to enhance his inventions and broaden his impact on technology.

Conclusion

David Foley's contributions to innovation, particularly with his patent on curvature determination, highlight his role as a significant figure in the field of invention. His work continues to inspire future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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