Yellow Springs, OH, United States of America

David F Lackey

This inventor holds 1 USPTO granted patent. Top assignee: Deuer Manufacturing Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David F Lackey. Retrieved from https://idiyas.com/inventor/david-f-lackey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of David F. Lackey

Introduction

David F. Lackey is an accomplished inventor based in Yellow Springs, OH (US). He has made significant contributions to the field of engineering, particularly with his innovative designs and patents. His work exemplifies the spirit of creativity and problem-solving that drives technological advancement.

Latest Patents

David holds a patent for a torque multiplying device, showcasing his expertise in mechanical engineering. This invention is designed to enhance the efficiency and effectiveness of various mechanical systems. With 1 patent to his name, David's contributions are noteworthy in the realm of innovation.

Career Highlights

David is currently employed at Deuer Manufacturing Inc., where he applies his skills and knowledge to develop cutting-edge solutions. His role at the company allows him to collaborate with other professionals and contribute to the advancement of manufacturing technologies. His dedication to his work has earned him respect among his peers.

Collaborations

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Conclusion

David F. Lackey's innovative spirit and dedication to engineering have led to significant advancements in mechanical design. His work continues to inspire future inventors and engineers in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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