Delmont, PA, United States of America

David F Byrne

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Rail Sts USA, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David F Byrne. Retrieved from https://idiyas.com/inventor/david-f-byrne

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of David F. Byrne

Introduction

David F. Byrne is a notable inventor based in Delmont, PA (US). He has made significant contributions to the field of railway technology. His innovative spirit is exemplified by his patent for an independent rail test release mechanism.

Latest Patents

David holds a patent for an independent rail test release mechanism. This mechanism is designed for a railway switch machine and includes a block that attaches to a lock box. The block moves in conjunction with the lock box, and a lift pin is operable to selectively engage and disengage the block with a slide bar. This invention enhances the functionality and safety of railway systems.

Career Highlights

David F. Byrne is currently employed at Hitachi Rail STS USA, Inc. His work at this company allows him to apply his innovative ideas in a practical setting. His contributions to railway technology are invaluable and demonstrate his commitment to improving transportation systems.

Collaborations

David has collaborated with talented coworkers such as Andrew Imhof and Sheldon Adam Benton. Their teamwork fosters an environment of creativity and innovation, leading to advancements in railway technology.

Conclusion

David F. Byrne is a dedicated inventor whose work in railway technology has made a significant impact. His patent for the independent rail test release mechanism showcases his innovative approach to solving complex problems in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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