Burlington, MA, United States of America

David F Botros

This inventor holds 1 USPTO granted patent. Top assignee: Nortel Networks Corporation. Active years: 2004.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of David F Botros

Introduction

David F Botros is a notable inventor based in Burlington, MA (US). He has made significant contributions to the field of optical circuit testing. His innovative approach has led to the development of a unique method and apparatus that enhances the efficiency of testing optical circuit modules.

Latest Patents

David F Botros holds a patent for a "Method and apparatus for improved testing of optical circuit modules." This invention introduces a novel method that allows for the simultaneous testing of multiple devices under test (DUTs). By applying a given optical signal to each DUT simultaneously, the testing process is streamlined. The test pack can query each DUT serially to obtain results and provide feedback for calibration. This method also allows all DUTs to be housed in a single environmental enclosure, which increases testing throughput by bringing them up to temperature simultaneously.

Career Highlights

David F Botros is associated with Nortel Networks Corporation, where he has contributed to advancements in optical technologies. His work has been instrumental in improving testing methodologies, which are crucial for the development of reliable optical circuit modules.

Collaborations

David has collaborated with notable colleagues such as Paul Boyd and Ronald N Parente. Their combined expertise has fostered an environment of innovation and progress within their field.

Conclusion

David F Botros exemplifies the spirit of innovation through his contributions to optical circuit testing. His patented method not only enhances testing efficiency but also sets a new standard in the industry.

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