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1 out of 7 Years Active: 2019
Title: The Innovations of David Etayo Salinas
Introduction
David Etayo Salinas is an accomplished inventor based in Mutilva Baja, Spain. He has made significant contributions to the field of thin film materials, particularly in quality inspection technologies. His innovative approach has led to the development of devices and methods that enhance the assessment of thin film materials.
Latest Patents
David holds a patent for a device that focuses on the quality inspection of thin film materials. This patent describes devices and methods for determining the quality of thin film materials provided on substrates, forming thin film material structures. The device includes a housing, a THz module with a THz source emitter and a THz detector, and a reflective base that is moveable relative to the THz module. The THz source emitter is designed to irradiate the thin film materials, while the THz detector measures at least one reflection of the irradiation. The device is capable of calculating a parameter indicative of the quality of the thin film material based on these reflection measurements.
Career Highlights
Throughout his career, David has worked with notable companies such as Das-Nano, S.L. and Asociación Centro de Investigación Cooperativa en Nanociencias (CIC Nanogune). His experience in these organizations has allowed him to refine his skills and contribute to advancements in nanotechnology and material science.
Collaborations
David has collaborated with several professionals in his field, including Eduardo Azanza Ladrón and Magdalena Chudzik. These collaborations have fostered innovation and have been instrumental in the development of new technologies.
Conclusion
David Etayo Salinas is a prominent figure in the field of thin film materials, with a focus on quality inspection technologies. His patent and career achievements reflect his dedication to innovation and advancement in material science.