The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Dec. 23, 2014
Das-nano, S.l., Tajonar, ES;
Asociacion Centro DE Investigación Cooperativa En Nanociencias (Cic Nanogune), Donostia, ES;
Graphenea, S.a., Donostia, ES;
Eduardo Azanza Ladrón, Gorraiz, ES;
Magdalena Chudzik, Mutilva Baja, ES;
Alex López Zorzano, Mutilva Baja, ES;
David Etayo Salinas, Mutilva Baja, ES;
Luis Eduardo Hueso Arroyo, Donostia, ES;
Amaia Zurutuza Elorza, Donostia, ES;
DAS-NANO, S.L., Tajonar, ES;
ASOCIACION CENTRO DE INVESTIGACION COOPERATIVE EN NANOCIENCIAS (CIC NANOGUNE), Donostia, ES;
GRAPHENEA, S.A., Donostia, ES;
Abstract
Devices and methods for determining the quality thin film materials are disclosed. The thin film materials are provided on substrates forming thin film material structures. The devices comprise a housing, a THz module with a THz source emitter and a THz detector, and a reflective base moveable relative to the THz module and configured to support the thin film material structures. The THz source emitter is configured to irradiate the thin film materials. The THz detector is configured to measure at least one reflection of the irradiation. The device is configured to calculate a parameter indicative of the quality of the thin film material based on said reflection measurements.